Instruments
JEOL 6490 Low-Vacuum Scanning Electron Microscope
Installed in 2008, our JEOL 6490LV SEM has secondary electron (SE), back-scattered electron (BSE), cathodoluminescence (CL), electron-backscatter diffraction (EBSD), and energy-dispersive X-ray (EDS) detectors.
JEOL 8200 Electron Microprobe (EPMA)
The JEOL JXA-8200 Electron Microprobe (EPMA) was installed in 2002. The JEOL JXA-8200 at UT is equipped with five wavelength dispersive spectrometers (WDS), Secondary Electron (SE), and Back Scattered Electron (BSE) detectors and Probe for EPMA software.
Bruker D8 Advance X-ray Diffractometer (XRD)
Installed in 2008, the Bruker D8 Advance provides routine, qualitative mineral identification and semi-quantitative modal mineralogy in rock powders. The D8 XRD can automatically multiple samples at a time.