SEM Technique: EBSD

Electron backscatter diffraction (EBSD) measures crystallographic orientations in situ at high speeds, allowing the collection of large datasets and orientation mapping. This allows explicit observation of grain and subgrain boundaries, interpretation of recrystallization mechanisms, and quantification of fiber strengths. This technique can be performed using a very thin carbon coating but is typically performed at 10-20 Pa chamber pressure on highly polished, uncoated surfaces.