SEM technique: EBSD

Electron back-scatter diffraction (EBSD) measures crystallographic orientations in-situ at high speeds, allowing the collection of large datasets and orientation mapping. This allows explicit observation of grain and subgrain boundaries, interpretation of recrystallization mechanisms, and quantification of fibre strengths. This technique can be performed using a very thin carbon coating, but is typically performed at 10-20 Pa chamber pressure on highly polished, uncoated surfaces.

Orientation map of dynamically recrystallized feldspar grain from lower-crustal shear zone in Saskatchewan, Canada. Orientation color-key to right.

Orientation map of dynamically recrystallized feldspar grain from lower-crustal shear zone in Saskatchewan, Canada. Orientation color-key to right.